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The Spectroscopy Group operates 2 bending magnet and 2 insertion device beamlines at the APS. Our primary techniques include X-ray Absorption and Emission Spectroscopy, which allow for the determination of the local atomic environment, oxidation state, and spin state of specific elements within complex samples under in-situ and operando conditions.
9-BM is a quick-scanning XAFS beamline capable of extended XAFS measurements in just a few seconds. It is optimized for low-energy measurements including P and S K-edges with a full in-situ and operando catalyst studies infrastructure.
20-BM beamline is primarily dedicated to XAFS.
25-ID-C and 25-ID-D and E is a newly-commissioned canted insertion device beamline with two independently operated branches for Advanced Spectroscopy, and Time Resolved Research programs. It boasts of both Si(111) monochromators and multilayer for non-resonant applications. | 
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