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XRS: Probing soft X-ray transitions with hard X-rays | |
The outboard branch of the 25-ID beamline will be home to the new APS-U XRS spectrometer. Low energy electron transitions with hard x-rays allow for transitions from core shells of light elements, and from higher shells of heavier elements. Hard x-rays are more easily combined with complex sample environments such as in-situ, in-operando, high pressure (diamond anvil), and liquid cells. The measurements are bulk sensitive due to the use of hard x-rays, and free of self absorption in non-resonant mode. Unlike traditional XANES, XRS is sensitive to non-dipolar transitions. The momentum transfer dependence can be minimized or enhanced. |
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Data Collection Example | |
| The figure at right shows the oxygen K-edge X-ray Raman signal from a thin-film sample of La0.6Sr 0.4CoO3 on a SrTiO3 substrate. At glancing incidence (red), total external reflection results in evanescent penetration of only the thin film. At higher angles of incidence (blue), volumetric average is dominated by the substrate. This is proof-of-principle for future studies of electrochemical interfaces. [Ref 47] | 
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